Mr. Christopher B. Shaver
at Univ of Tennessee Knoxville
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9213, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVI
KEYWORDS: Fabrication, Semiconductors, Oxides, Security technologies, Sensors, Crystals, Semiconductor materials, Diodes, Uranium, Crystallography

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