Dr. Christopher G. Shaw
Technical Fellow at Boeing Co
SPIE Involvement:
Conference Program Committee | Author
Publications (7)

PROCEEDINGS ARTICLE | September 2, 2008
Proc. SPIE. 7069, Optical System Contamination: Effects, Measurements, and Control 2008
KEYWORDS: Contamination, Glasses, Ultraviolet radiation, Particles, Solar cells, Coating, Reflectivity, Adaptive optics, Space operations, Scatter measurement

PROCEEDINGS ARTICLE | October 15, 2004
Proc. SPIE. 5526, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control
KEYWORDS: Thin films, Contamination, Data modeling, Silicon, Lamps, Optical testing, Scanning electron microscopy, Transmission electron microscopy, Transmittance, Vacuum ultraviolet

PROCEEDINGS ARTICLE | November 11, 1996
Proc. SPIE. 2864, Optical System Contamination V, and Stray Light and System Optimization
KEYWORDS: Contamination, Calibration, Ultraviolet radiation, Molecules, Hydrogen, Mercury, Lamps, Radiometry, Space operations, Temperature metrology

PROCEEDINGS ARTICLE | November 11, 1996
Proc. SPIE. 2864, Optical System Contamination V, and Stray Light and System Optimization
KEYWORDS: Telescopes, Mirrors, Contamination, Sensors, Particles, Nitrogen, Space telescopes, Bidirectional reflectance transmission function, Signal detection, Cryogenics

PROCEEDINGS ARTICLE | December 18, 1992
Proc. SPIE. 1754, Optical System Contamination: Effects, Measurement, Control III
KEYWORDS: Telescopes, Mirrors, Contamination, Sensors, Particles, Copper, Ions, Space telescopes, Beryllium, Cryogenics

PROCEEDINGS ARTICLE | November 1, 1990
Proc. SPIE. 1329, Optical System Contamination: Effects, Measurement, Control II
KEYWORDS: Electron beams, Electronics, Contamination, Aerospace engineering, Copper, Dielectrics, Electrons, Control systems, Space operations, Contamination control

Showing 5 of 7 publications
Conference Committee Involvement (2)
Optical System Contamination: Effects, Measurements and Control IX
15 August 2006 | San Diego, California, United States
Optical System Contamination: Effects, Measurements, and Control VIII
2 August 2004 | Denver, Colorado, United States
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