Dr. Christopher C. Walton
Staff Experimental Physicist at Lawrence Livermore National Lab
SPIE Involvement:
Publications (30)

Proceedings Article | 4 October 2022 Presentation + Paper
Chris Walton, Bernard Kozioziemski, Jeffrey Fein, Suzanne Romaine, Julia Vogel
Proceedings Volume 12240, 1224005 (2022) https://doi.org/10.1117/12.2633400
KEYWORDS: Coating, Reflectivity, Multilayers, X-ray optics, X-ray imaging, Plasmas, Optical design, Fusion energy, X-rays, Monte Carlo methods

Proceedings Article | 5 June 2018 Paper
Proceedings Volume 10691, 106910U (2018) https://doi.org/10.1117/12.2314257
KEYWORDS: Reflectivity, Multilayers, Silicon, Interfaces, X-rays, Molybdenum, Silicon carbide, Data modeling, Systems modeling

Proceedings Article | 29 August 2017 Paper
A. Ames, D. Ampleford, C. Bourdon, R. Bruni, K. Kilaru, B. Kozioziemski, M. Pivovaroff, B. Ramsey, S. Romaine, J. Vogel, C. Walton, M. Wu
Proceedings Volume 10399, 103991X (2017) https://doi.org/10.1117/12.2275721
KEYWORDS: Multilayers, X-ray optics, Optical coatings, Laser optics, X-ray characterization, X-rays, Pulsed power, Prototyping, Optical fabrication, X-ray imaging

Proceedings Article | 9 September 2015 Paper
Nicolai Brejnholt, Jay Ayers, Thomas McCarville, Tom Pardini, Louisa Pickworth, David Bradley, Todd Decker, Stefan Hau-Riege, Randal Hill, Michael Pivovaroff, Regina Soufli, Julia Vogel, Chris Walton
Proceedings Volume 9591, 95910J (2015) https://doi.org/10.1117/12.2187150
KEYWORDS: Mirrors, Spatial resolution, National Ignition Facility, Calibration, Multilayers, X-rays, X-ray imaging, Sensors, Reflectivity, Microscopes

Proceedings Article | 10 September 2014 Paper
M. Ayers, L. Pickworth, T. Decker, R. Hill, T. Pardini, T. McCarville, N. Shingleton, C. Smith, C. Bailey, P. Bell, D. Bradley, N. Brejnholt, S. Hau-Riege, M. Pivovaroff, P. Mirkarimi, M. Vitalich, J. Vogel, C. Walton, J. Kilkenny
Proceedings Volume 9211, 92110C (2014) https://doi.org/10.1117/12.2065253
KEYWORDS: Mirrors, Diagnostics, National Ignition Facility, X-rays, Digital Light Processing, X-ray imaging, Image filtering, Optical alignment, Microscopes, Sensors

Showing 5 of 30 publications
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