Dr. Chrystel Ambard
at Commissariat à l'Energie Atomique
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | May 9, 2012
Proc. SPIE. 8439, Optical Sensing and Detection II
KEYWORDS: Gas sensors, Explosives detection, Silica, Sensors, Nanoparticles, Luminescence, Molecules, Explosives, Sol-gels, Chemical fiber sensors

PROCEEDINGS ARTICLE | December 31, 2009
Proc. SPIE. 7504, Laser-Induced Damage in Optical Materials: 2009
KEYWORDS: Diamond, Polishing, Silica, Etching, Laser induced damage, Manufacturing, Surface roughness, Diagnostics, Optics manufacturing, Magnetorheological finishing

PROCEEDINGS ARTICLE | December 31, 2009
Proc. SPIE. 7504, Laser-Induced Damage in Optical Materials: 2009
KEYWORDS: Polishing, Contamination, Silica, Etching, Doping, Chemical analysis, Chemical elements, Barium, HF etching, Plasma

PROCEEDINGS ARTICLE | December 30, 2008
Proc. SPIE. 7132, Laser-Induced Damage in Optical Materials: 2008
KEYWORDS: Diamond, Polishing, Optical spheres, Silica, Etching, High power lasers, Laser development, Abrasives, Magnetorheological finishing, HF etching

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