Miss Chufan Jiang
at
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 4, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Cameras, 3D metrology, Projection systems, Embedded systems, Phase measurement, Fringe analysis, Calibration, Metrology, 3D vision, Machine vision, Imaging systems, 3D modeling, Phase shifts, 3D image processing, Algorithm development

PROCEEDINGS ARTICLE | May 19, 2016
Proc. SPIE. 9868, Dimensional Optical Metrology and Inspection for Practical Applications V
KEYWORDS: 3D metrology, Fringe analysis, Cameras, High dynamic range imaging, Phase retrieval, 3D modeling, Phase shifts, Reconstruction algorithms, Quality measurement, Computer simulations

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