Chun Chieh Wang
Researcher at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | August 24, 2010
Proc. SPIE. 7767, Instrumentation, Metrology, and Standards for Nanomanufacturing IV
KEYWORDS: Confocal microscopy, Lithography, Light sources, Sensors, Spectroscopy, Inspection, Colorimetry, Image sensors, Objectives, Nanoimprint lithography

PROCEEDINGS ARTICLE | September 15, 2008
Proc. SPIE. 7073, Applications of Digital Image Processing XXXI
KEYWORDS: Defect detection, Glasses, Image processing, Manufacturing, Inspection, Lens design, Charge-coupled devices, Liquid lenses, Liquids, Defect inspection

PROCEEDINGS ARTICLE | August 25, 2008
Proc. SPIE. 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II
KEYWORDS: Three dimensional sensing, Sensors, Calibration, Image segmentation, Inspection, Image registration, CCD cameras, 3D metrology, Sensing systems, Data fusion

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