Dr. Chun-Wei Chang
at National Chiao Tung Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 February 2008
Proc. SPIE. 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
KEYWORDS: Resistance, Actuators, Fusion energy, Calibration, Nickel, Interfaces, Oxides, Assembly equipment, Optical components, Microopto electromechanical systems

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top