Dr. Chung M. Wong
Engineer Materials and Process at
SPIE Involvement:
Conference Program Committee | Author
Publications (7)

PROCEEDINGS ARTICLE | September 19, 2018
Proc. SPIE. 10748, Systems Contamination: Prediction, Control, and Performance 2018
KEYWORDS: Contamination, Sensors, Particles, Molecules, Computer simulations, Monte Carlo methods, Contamination control

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9952, Systems Contamination: Prediction, Control, and Performance 2016
KEYWORDS: FT-IR spectroscopy, Contamination, Spectroscopy, Molecules, Silicon, Chemical analysis, Space operations, Semiconducting wafers, Adhesives, Absorption

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9952, Systems Contamination: Prediction, Control, and Performance 2016
KEYWORDS: Microscopes, Logic, Contamination, Image processing, Particles, Silicon, Light scattering, Image analysis, Semiconducting wafers, Picture Archiving and Communication System

PROCEEDINGS ARTICLE | September 9, 2014
Proc. SPIE. 9196, Systems Contamination: Prediction, Measurement, and Control 2014
KEYWORDS: Optical components, Telescopes, Contamination, Argon, Particles, Molecules, Monte Carlo methods, Space telescopes, Systems modeling, Instrument modeling

PROCEEDINGS ARTICLE | February 19, 2013
Proc. SPIE. 8655, Image Processing: Algorithms and Systems XI
KEYWORDS: Target detection, Hyperspectral imaging, Short wave infrared radiation, Detection and tracking algorithms, Imaging systems, Sensors, Control systems, Data acquisition, Sensor performance, Hyperspectral target detection

PROCEEDINGS ARTICLE | January 25, 2011
Proc. SPIE. 7872, Parallel Processing for Imaging Applications
KEYWORDS: Optical filters, Avalanche photodetectors, Visualization, Cameras, LIDAR, Sensors, Clouds, Data processing, Pulsed laser operation, 3D image processing

Showing 5 of 7 publications
Conference Committee Involvement (2)
Systems Contamination: Prediction, Control, and Performance 2016
31 August 2016 | San Diego, California, United States
Parallel Processing for Imaging Applications II
23 January 2012 | Burlingame, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top