Chunseon Choi
at SK Hynix Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 23 October 2015 Paper
Proceedings Volume 9635, 96351T (2015) https://doi.org/10.1117/12.2196938
KEYWORDS: Critical dimension metrology, Etching, Chromium, Scanning electron microscopy, Photomasks, Transmission electron microscopy, Double patterning technology, Phase shifts, Image processing, Signal processing

Proceedings Article | 29 October 2014 Paper
Proceedings Volume 9235, 92351R (2014) https://doi.org/10.1117/12.2066283
KEYWORDS: Photomasks, Transmittance, Semiconducting wafers, Nanoimprint lithography, Lithography, Binary data, Chromium, Etching, Image analysis, Extreme ultraviolet

Proceedings Article | 8 November 2012 Paper
Dong Shin, Sang Jo, Hee Jang, Yun Hong, Dae Hwang, Chung Choi, Dong Jang, Ho Jung, Tae Ha, Sang Kim, Dong Yim
Proceedings Volume 8522, 85220R (2012) https://doi.org/10.1117/12.964974
KEYWORDS: Etching, Chromium, Photomasks, Particles, Critical dimension metrology, Inspection, Reliability, Optics manufacturing, Manufacturing

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