Dr. Chunwei Zhang
at Xi'an Jiaotong Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Coherence imaging, Fringe analysis, 3D applications, Imaging systems, 3D metrology, Phase measurement

PROCEEDINGS ARTICLE | February 19, 2015
Proc. SPIE. 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014)
KEYWORDS: Signal to noise ratio, Fringe analysis, Calibration, Manufacturing, Image resolution, Phase shift keying, 3D modeling, 3D metrology, Systems engineering, Phase shifts

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