Dr. Chunwei Zhang
at Xi'an Jiaotong Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Phase measurement, 3D applications, 3D metrology, Fringe analysis, Coherence imaging, Imaging systems

PROCEEDINGS ARTICLE | February 19, 2015
Proc. SPIE. 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014)
KEYWORDS: Phase shifts, 3D metrology, Phase shift keying, Signal to noise ratio, 3D modeling, Image resolution, Fringe analysis, Calibration, Manufacturing, Systems engineering

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