Dr. Claas Falldorf
at Bremer Institut für angewandte Strahltechnik GmbH
SPIE Involvement:
Conference Program Committee | Journal Editorial Board Member | Author
Publications (31)

PROCEEDINGS ARTICLE | September 27, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Mirrors, Light emitting diodes, Coherence (optics), Imaging systems, Interferometers, Cameras, Reflectivity, Interferometry, Spatial light modulators, Optical interferometry

PROCEEDINGS ARTICLE | September 14, 2018
Proc. SPIE. 10744, Laser Beam Shaping XVIII
KEYWORDS: Gold, Diamond turning, Holograms, Diffractive optical elements, Modulation, Polymers, Computer generated holography, Wave propagation, Phase measurement, Multiphoton lithography

SPIE Journal Paper | December 7, 2017
OE Vol. 56 Issue 12
KEYWORDS: Holograms, Digital holography, Speckle, Multiplexing, Cameras, Denoising, Holography, Objectives, Semiconductor lasers, Optical engineering

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Metrology, Light emitting diodes, Sensors, Interferometry, Wavefront sensors, Wavefronts, Optical testing, Spatial light modulators, Aspheric optics, Aspheric lenses, Freeform optics, Optics manufacturing, Shearing interferometers

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10233, Holography: Advances and Modern Trends V
KEYWORDS: Confocal microscopy, Mirrors, Beam splitters, Light sources, Phase shifting, Holography, Metrology, Digital holography, Cameras, Microscopy, Inspection, Optical testing, Optical inspection, Optical interferometry, Charge-coupled devices

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10233, Holography: Advances and Modern Trends V
KEYWORDS: Holograms, Holography, Digital holography, Speckle, Cameras, Denoising, Microscopy, Multiplexing, Optical metrology

Showing 5 of 31 publications
Conference Committee Involvement (4)
Holography: Advances and Modern Trends
1 April 2019 | Prague, Czech Republic
Holography: Advances and Modern Trends
24 April 2017 | Prague, Czech Republic
Applied Advanced Optical Metrology Solutions
11 August 2015 | San Diego, California, United States
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
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