Dr. Claudio E. Bruschini
Scientist / Project Manager at Ecole Polytechnique Fédérale de Lausanne
SPIE Involvement:
Conference Program Committee | Author
Publications (10)

PROCEEDINGS ARTICLE | February 21, 2017
Proc. SPIE. 10069, Multiphoton Microscopy in the Biomedical Sciences XVII
KEYWORDS: Electronics, Biomedical optics, Imaging systems, Sensors, Luminescence, Photons, Molecules, Raman spectroscopy, Data processing, CMOS technology, Fluorescence lifetime imaging, Picosecond phenomena, Avalanche photodiodes, Fluorescence correlation spectroscopy, Imaging arrays, Positron emission tomography, Standards development

PROCEEDINGS ARTICLE | April 29, 2016
Proc. SPIE. 9899, Optical Sensing and Detection IV
KEYWORDS: Photodetectors, CMOS sensors, Imaging systems, Cameras, Sensors, Single photon, Field programmable gate arrays, Image sensors, Picosecond phenomena, Avalanche photodiodes, Pulsed laser operation, 3D-TOF imaging

PROCEEDINGS ARTICLE | March 1, 2016
Proc. SPIE. 9714, Single Molecule Spectroscopy and Superresolution Imaging IX
KEYWORDS: Signal to noise ratio, Photodetectors, Point spread functions, Super resolution, Imaging systems, Microscopy, Luminescence, Molecules, Single photon, Image resolution, Image quality, Microlens, Fluorescence lifetime imaging, Avalanche photodiodes

PROCEEDINGS ARTICLE | March 4, 2015
Proc. SPIE. 9313, Advanced Biomedical and Clinical Diagnostic and Surgical Guidance Systems XIII
KEYWORDS: Near infrared, Tumors, Tissues, Imaging systems, Sensors, Luminescence, Fluorescence lifetime imaging, Picosecond phenomena, In vivo imaging, In vitro testing

PROCEEDINGS ARTICLE | May 15, 2014
Proc. SPIE. 9141, Optical Sensing and Detection III
KEYWORDS: Photodetectors, Cameras, Sensors, Luminescence, Image resolution, Field programmable gate arrays, Time correlated photon counting, Fluorescence lifetime imaging, Picosecond phenomena, Camera shutters

PROCEEDINGS ARTICLE | May 8, 2014
Proc. SPIE. 9129, Biophotonics: Photonic Solutions for Better Health Care IV
KEYWORDS: CMOS sensors, Solar concentrators, Sensors, Photons, Crystals, Scintillators, Data processing, Scintillation, Positron emission tomography, Intelligent sensors

Showing 5 of 10 publications
Conference Committee Involvement (1)
Non-Intrusive Inspection Technologies
17 April 2006 | Orlando (Kissimmee), Florida, United States
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