Cliff G. M. De Locht
Product Manager at Melexis NV
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 February 2008
Proc. SPIE. 6890, Optical Components and Materials V
KEYWORDS: Safety, Optical sensors, Imaging systems, Cameras, Sensors, Error analysis, Photodiodes, Semiconducting wafers, Optics manufacturing, Optical arrays

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