Cody Bezik
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 22 August 2018
JM3 Vol. 17 Issue 03
KEYWORDS: Directed self assembly, Polymethylmethacrylate, Picosecond phenomena, Tomography, System on a chip, Chemistry, Scanning transmission electron microscopy, Transmission electron microscopy, Semiconducting wafers, 3D image processing

Proceedings Article | 19 March 2018
Proc. SPIE. 10584, Novel Patterning Technologies 2018
KEYWORDS: Polymethylmethacrylate, Picosecond phenomena, Directed self assembly, Tomography, Transmission electron microscopy, System on a chip, Chemistry, Semiconducting wafers, 3D metrology, Scanning transmission electron microscopy

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