Dr. Colin K. Drummond
at ASM International
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 February 2008 Paper
C. Drummond, F. Lisy
Proceedings Volume 6884, 68840S (2008) https://doi.org/10.1117/12.764500
KEYWORDS: Databases, Microsystems, Computer aided design, Packaging, Tolerancing, Microelectromechanical systems, Reliability, Clocks, Data modeling, Materials processing

Conference Committee Involvement (1)
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
28 January 2009 | San Jose, California, United States
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