Congyong Zhu
at Virginia Commonwealth Univ
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | March 27, 2013
Proc. SPIE. 8625, Gallium Nitride Materials and Devices VIII
KEYWORDS: Plasmons, Lithium, Reliability, Gallium nitride, Aluminum, Aluminum nitride, Phonons, Transistors, Microwave radiation, Heterojunctions

PROCEEDINGS ARTICLE | March 4, 2013
Proc. SPIE. 8625, Gallium Nitride Materials and Devices VIII
KEYWORDS: Interfaces, Reliability, Fourier transforms, Gallium nitride, Capacitance, Phonons, Field effect transistors, Phase measurement, Microwave radiation, Heterojunctions

PROCEEDINGS ARTICLE | February 28, 2012
Proc. SPIE. 8262, Gallium Nitride Materials and Devices VII
KEYWORDS: Lithium, Reliability, Gallium nitride, Phonons, Transistors, Field effect transistors, Applied physics, Molybdenum, Heterojunctions, Piezoelectric effects

PROCEEDINGS ARTICLE | February 28, 2012
Proc. SPIE. 8262, Gallium Nitride Materials and Devices VII
KEYWORDS: Ultrafast phenomena, Ultrafast measurement systems, Gallium nitride, Phonons, Transistors, Phase measurement, Molybdenum, Semiconducting wafers, Heterojunctions, Astatine

PROCEEDINGS ARTICLE | February 28, 2012
Proc. SPIE. 8262, Gallium Nitride Materials and Devices VII
KEYWORDS: Calibration, Indium, Reliability, Gallium nitride, Measurement devices, Transistors, Phase measurement, Semiconducting wafers, Heterojunctions, Piezoelectric effects

PROCEEDINGS ARTICLE | March 4, 2011
Proc. SPIE. 7939, Gallium Nitride Materials and Devices VI
KEYWORDS: Oxides, Scattering, Dielectrics, Interfaces, Interference (communication), Gallium nitride, Sapphire, Transistors, Heterojunctions, Temperature metrology

Showing 5 of 8 publications
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