Prof. Conrad R. Stoldt
at Univ of Colorado Boulder
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

PROCEEDINGS ARTICLE | September 4, 2010
Proc. SPIE. 7795, Optical Technologies for Arming, Safing, Fuzing, and Firing VI
KEYWORDS: Microelectromechanical systems, Data modeling, Etching, Crystals, Silicon, Semiconductor lasers, Raman spectroscopy, Explosives, Picosecond phenomena, Semiconducting wafers

PROCEEDINGS ARTICLE | April 27, 2007
Proc. SPIE. 6525, Active and Passive Smart Structures and Integrated Systems 2007
KEYWORDS: Iron, Modulation, Nanoparticles, Particles, Composites, Interfaces, Chemistry, Transmission electron microscopy, Microwave radiation, Absorption

PROCEEDINGS ARTICLE | January 6, 2006
Proc. SPIE. 6111, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
KEYWORDS: Microelectromechanical systems, Gold, Oxides, Microsystems, Etching, Metals, Silicon, Chemistry, Corrosion, Picosecond phenomena

Conference Committee Involvement (1)
MEMS/MOEMS Technologies and Applications II
10 November 2004 | Beijing, China
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