Prof. Cor L. Claeys
Director Advanced Semiconductor Technologies at IMEC
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 8 January 2013
Proc. SPIE. 8700, International Conference Micro- and Nano-Electronics 2012
KEYWORDS: Oxides, Silica, Dielectrics, Silicon, Diagnostics, Nondestructive evaluation, Capacitance, Solids, Field effect transistors

Proceedings Article | 25 May 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Oxides, Silicon, Resistance, Time metrology, Ionization, Measurement devices, Transistors, Field effect transistors, Semiconducting wafers, Semiconductor physics

Proceedings Article | 25 May 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Oxides, Oscillators, Switching, Denoising, Dielectrics, Transistors, Field effect transistors, CMOS technology, Analog electronics, System on a chip

Proceedings Article | 1 May 1994
Proc. SPIE. 2172, Charge-Coupled Devices and Solid State Optical Sensors IV
KEYWORDS: Switches, Capacitors, Imaging systems, Sensors, Image resolution, Amplifiers, Photodiodes, Capacitance, Machine vision, Transistors

Proceedings Article | 11 March 1994
Proc. SPIE. 2183, Machine Vision Applications in Industrial Inspection II
KEYWORDS: Mirrors, Holograms, Digital holography, Image processing, Inspection, Image resolution, Image sensors, Fractal analysis, Zoom lenses, Convolution

Showing 5 of 12 publications
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