Prof. Cor L. Claeys
Director Advanced Semiconductor Technologies at imec
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 8 January 2013 Paper
Proc. SPIE. 8700, International Conference Micro- and Nano-Electronics 2012
KEYWORDS: Dielectrics, Oxides, Field effect transistors, Capacitance, Silicon, Silica, Solids, Nondestructive evaluation, Diagnostics

Proceedings Article | 25 May 2004 Paper
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Field effect transistors, Silicon, Resistance, Oxides, Semiconducting wafers, Transistors, Time metrology, Measurement devices, Semiconductor physics, Ionization

Proceedings Article | 25 May 2004 Paper
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: CMOS technology, Oxides, Field effect transistors, Dielectrics, Transistors, Analog electronics, Switching, System on a chip, Denoising, Oscillators

Proceedings Article | 1 May 1994 Paper
Proc. SPIE. 2172, Charge-Coupled Devices and Solid State Optical Sensors IV
KEYWORDS: Amplifiers, Capacitors, Sensors, Imaging systems, Image resolution, Transistors, Machine vision, Photodiodes, Switches, Capacitance

Proceedings Article | 11 March 1994 Paper
Proc. SPIE. 2183, Machine Vision Applications in Industrial Inspection II
KEYWORDS: Inspection, Image sensors, Holograms, Zoom lenses, Fractal analysis, Image processing, Image resolution, Convolution, Mirrors, Digital holography

Showing 5 of 12 publications
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