Cosimo Fabroni
at Univ degli Studi di Firenze
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 March 2002
Proc. SPIE. 4664, Machine Vision Applications in Industrial Inspection X
KEYWORDS: Eye, Statistical analysis, Image processing, Scanners, Control systems, Colorimetry, Light sources and illumination, Charge-coupled devices, Spectrophotometry, Tolerancing

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