Prof. Cristell Maneux
at Univ Bordeaux 1
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Semiconductors, Indium gallium arsenide, Metals, Interfaces, Silicon, Diffusion, Reliability, Resistance, Transistors, Failure analysis

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