Mr. Curtis M. Webb
IR Systems Engineer at Northrop Grumman Electronic Systems
SPIE Involvement:
Conference Program Committee | Author
Publications (14)

PROCEEDINGS ARTICLE | June 5, 2013
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Infrared imaging, Short wave infrared radiation, Imaging systems, Cameras, Sensors, Semiconductor lasers, Forward looking infrared, Performance modeling, Atmospheric modeling, Systems modeling

PROCEEDINGS ARTICLE | August 22, 2003
Proc. SPIE. 5076, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIV
KEYWORDS: Thermography, Infrared imaging, Imaging systems, Sensors, Image intensifiers, Modulation transfer functions, Forward looking infrared, Performance modeling, Thermal modeling, Systems modeling

PROCEEDINGS ARTICLE | July 17, 2000
Proc. SPIE. 4030, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI
KEYWORDS: Target detection, Detection and tracking algorithms, Visualization, Image processing, Buildings, Image display, Algorithm development, Field emission displays, Forward looking infrared, Automatic control

SPIE Journal Paper | May 1, 1999
OE Vol. 38 Issue 05
KEYWORDS: Sensors, Staring arrays, Imaging systems, Spatial frequencies, Modulation transfer functions, Visual system, Phase shift keying, Modulation, Eye, Visual process modeling

SPIE Journal Paper | May 1, 1999
OE Vol. 38 Issue 05
KEYWORDS: Modulation transfer functions, Imaging systems, Sensors, Infrared imaging, Performance modeling, Infrared radiation, Minimum resolvable temperature difference, Temperature metrology, Systems modeling, Infrared sensors

SPIE Journal Paper | June 1, 1998
OE Vol. 37 Issue 06
KEYWORDS: Sensors, Imaging systems, Modulation, Phase shift keying, Modulation transfer functions, Signal detection, Analog electronics, Temperature metrology, Target detection, Electronics

Showing 5 of 14 publications
Conference Committee Involvement (16)
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
17 April 2018 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
11 April 2017 | Anaheim, California, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
19 April 2016 | Baltimore, Maryland, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
21 April 2015 | Baltimore, Maryland, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
6 May 2014 | Baltimore, Maryland, United States
Showing 5 of 16 published special sections
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