Dr. Cyril A. Hnatovsky
at Australian National Univ
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 12 May 2016 Paper
Stephen Mihailov, Dan Grobnic, Robert Walker, Cyril Hnatovsky, Huimin Ding, David Coulas, Ping Lu
Proceedings Volume 9852, 98520F (2016) https://doi.org/10.1117/12.2220789
KEYWORDS: Fiber Bragg gratings, Sensors, Reflectivity, Femtosecond phenomena, Optical fibers, Annealing, Ultraviolet radiation, Temperature metrology, Modulation, Pulsed laser operation

Proceedings Article | 13 March 2007 Paper
Proceedings Volume 6458, 64581B (2007) https://doi.org/10.1117/12.699157
KEYWORDS: Silica, Polarization, Femtosecond phenomena, Nanolithography, Nanostructures, Capillaries, Scanning electron microscopy, Microfluidics, Etching, Wet etching

Proceedings Article | 13 October 2005 Paper
Scott S.-H. Yam, Cyril Hnatovsky, Rod Taylor, Fu-Tai An, Supriyo Sinha
Proceedings Volume 5970, 59701P (2005) https://doi.org/10.1117/12.628616
KEYWORDS: Polarization, Multimode fibers, Local area networks, Refractive index, Modulation, Single mode fibers, Eye, Interferometry, Data transmission, Light emitting diodes

Proceedings Article | 4 October 2005 Paper
Rajeev Pattathil, Cyril Hnatovsky, Ravi-Bhardwaj Vedula, Eli Simova, Rod Taylor, David Rayner, Paul Corkum
Proceedings Volume 5971, 59711D (2005) https://doi.org/10.1117/12.629965
KEYWORDS: Plasma, Nanostructures, Silica, Femtosecond phenomena, Ionization, Waveguides, Glasses, Polarization, Dielectrics, Chromium

Proceedings Article | 17 February 2003 Paper
Proceedings Volume 4833, (2003) https://doi.org/10.1117/12.473921
KEYWORDS: Waveguides, Near field scanning optical microscopy, Spatial resolution, Atomic force microscopy, Refraction, Profiling, Wet etching, Near field optics, Reflection, Silica

Showing 5 of 6 publications
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