Dr. Céline Gouldieff Profile

Dr. Céline Gouldieff

at Institut de Physique de Rennes

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 23 November 2015 Paper

Characterization of damage precursor density from laser damage probability measurements with non-Gaussian beams

F. Wagner, A. Melninkaitis, G. Batavičiutė, C. Gouldieff, L. Smalakys, A. Beaudier, J.-Y. Natoli

Proceedings Volume 9632, 96321O (2015) https://doi.org/10.1117/12.2196604

KEYWORDS: Laser beam diagnostics, Laser induced damage, Beam shaping, Resistance, Optical components, Dielectrics, Laser damage threshold, Systems modeling, Pulsed laser operation, Laser systems engineering, Gaussian beams, Optical simulations, Data modeling, Laser optics, Cameras, Laser therapeutics

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Proceedings Article | 31 October 2014 Paper

Study of laser-induced fatigue effects in synthetic fused silica in the UV

C. Gouldieff, F. Wagner, J.-Y. Natoli

Proceedings Volume 9237, 923725 (2014) https://doi.org/10.1117/12.2069658

KEYWORDS: Silica, Ultraviolet radiation, Laser induced damage, Laser damage threshold, Laser applications, Neodymium, Resistance, Glasses, High power lasers, Pulsed laser operation

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Proceedings Article | 9 July 2013 Paper

Influence of the test parameters on LIDT determination for single and multiple laser irradiations in optical components in nanosecond regime

Jean-Yves Natoli, Frank Wagner, Céline Gouldieff, Mireille Commandré

Proceedings Volume 8786, 878618 (2013) https://doi.org/10.1117/12.2020416

KEYWORDS: Laser induced damage, Silica, Beam shaping, Optical components, Laser damage threshold, Laser irradiation, Raster graphics, Crystals, Ferroelectric materials, Data modeling

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Proceedings Article | 4 December 2012 Paper

Oxide mixtures for UV coatings

Céline Gouldieff, Frank Wagner, Lars Jensen, Mathias Mende, Jean-Yves Natoli, Detlev Ristau

Proceedings Volume 8530, 85300T (2012) https://doi.org/10.1117/12.977494

KEYWORDS: Oxides, Laser induced damage, Binary data, Ultraviolet radiation, Laser damage threshold, Silica, Refractive index, Ultraviolet coatings, Data modeling, Cameras

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SPIE Journal Paper | 13 July 2012

Multipulse laser damage in potassium titanyl phosphate: statistical interpretation of measurements and the damage initiation mechanism

Frank Wagner, Anne Hildenbrand, Hassan Akhouayri, Céline Gouldieff, Laurent Gallais, Mireille Commandré, Jean-Yves Natoli

OE, Vol. 51, Issue 12, 121806, (July 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.12.121806

KEYWORDS: Data modeling, Laser induced damage, Ferroelectric materials, Statistical modeling, Laser damage threshold, Nonlinear crystals, Crystals, Optical engineering, Laser stabilization, Chemical species

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Proceedings Article | 23 November 2011 Paper

Defect formation in oxide thin films

Lars Jensen, Frank Wagner, Mathias Mende, Céline Gouldieff, Holger Blaschke, Jean-Yves Natoli, Detlev Ristau

Proceedings Volume 8190, 81900D (2011) https://doi.org/10.1117/12.899113

KEYWORDS: Silica, Oxides, Laser induced damage, Ultraviolet radiation, Laser damage threshold, Thin films, Data modeling, Thin film coatings, Ion beams, Data acquisition

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Showing 5 of 6 publications

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