Dr. D. C. Hurley
Physicist at National Institute of Standards and Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (2)

Proceedings Article | 7 June 2002
Proc. SPIE. 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
KEYWORDS: Calibration, Glasses, Silicon, Atomic force microscopy, Scanning electron microscopy, Finite element methods, Aluminum, Niobium, Acoustics, Testing and analysis

Proceedings Article | 24 April 2002
Proc. SPIE. 4669, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications III
KEYWORDS: Potassium, Glasses, Spectroscopy, Electrons, Silicon, Gamma radiation, Charge-coupled devices, Neodymium, Muons, Lead

Conference Committee Involvement (4)
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV
1 March 2006 | San Diego, CA, United States
Testing, Reliability, and Application of Micro- and Nano-Material Systems III
9 March 2005 | San Diego, CA, United States
Testing, Reliability, and Application of Micro-and Nano-Material Systems II
15 March 2004 | San Diego, CA, United States
Testing, Reliability, and Application of Micro- and Nano-Material Systems
3 March 2003 | San Diego, California, United States
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