Dr. Daehwa Jeong
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 17 November 2008 Paper
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Microscopes, Defect detection, Sensors, Particles, Microchannel plates, X-rays, Inspection, Image sensors, Spatial resolution, X-ray imaging

Proceedings Article | 19 October 2006 Paper
Proc. SPIE. 6375, Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems
KEYWORDS: Defect detection, Data modeling, Etching, Image processing, Inspection, Distortion, Feature extraction, Image registration, Algorithm development, Binary data

Proceedings Article | 6 December 2005 Paper
Proc. SPIE. 6051, Optomechatronic Machine Vision
KEYWORDS: Opto mechatronics, Detection and tracking algorithms, Glasses, Image processing, Particles, Inspection, LCDs, Photomasks, Algorithm development, Defect inspection

Proceedings Article | 25 October 2004 Paper
Proc. SPIE. 5602, Optomechatronic Sensors, Actuators, and Control
KEYWORDS: Optical fibers, Fabry–Perot interferometers, Fiber optics, Cladding, Sensors, Single mode fibers, Control systems, Fiber optics sensors, Temperature sensors, Temperature metrology

Proceedings Article | 25 October 2004 Paper
Proc. SPIE. 5602, Optomechatronic Sensors, Actuators, and Control
KEYWORDS: Silica, Scattering, Calibration, Particles, Light scattering, Laser scattering, Transmission electron microscopy, Rayleigh scattering, Fractal analysis, Scatter measurement

Showing 5 of 9 publications
Conference Committee Involvement (4)
Optomechatronic Actuators and Manipulation II
1 October 2006 | Boston, Massachusetts, United States
Optomechatronic Actuators and Manipulation
5 December 2005 | Sapporo, Japan
Optomechatronic Sensors, Actuators, and Control
25 October 2004 | Philadelphia, Pennsylvania, United States
Optomechatronic Systems IV
28 October 2003 | Providence, RI, United States
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