Daisaku Mochida
at Nikon Tsubasa Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 24 March 2008 Paper
Proc. SPIE. 6922, Metrology, Inspection, and Process Control for Microlithography XXII
KEYWORDS: Critical dimension metrology, Semiconducting wafers, Inspection, Birefringence, Polarization, Polarizers, Scanning electron microscopy, Objectives, Edge roughness, Data modeling

Proceedings Article | 29 June 2006 Paper
Proc. SPIE. 6269, Ground-based and Airborne Instrumentation for Astronomy
KEYWORDS: Telescopes, Mirrors, Spectrographs, Astronomical imaging, Electroluminescence, Stars, Monochromatic aberrations, CCD cameras, Imaging systems, Astronomy

Proceedings Article | 30 September 2004 Paper
Proc. SPIE. 5492, Ground-based Instrumentation for Astronomy
KEYWORDS: Spectrographs, Telescopes, Control systems, Sensors, Astronomical imaging, Control systems design, Imaging systems, Cameras, Computing systems, Infrared radiation

Proceedings Article | 7 March 2003 Paper
Proc. SPIE. 4841, Instrument Design and Performance for Optical/Infrared Ground-based Telescopes
KEYWORDS: Spectrographs, Cameras, Telescopes, Silica, Mirrors, Connectors, Spine, Spectral resolution, Imaging systems, Astronomical imaging

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top