Dr. Dale E. Ewbank
Senior Lecturer at Rochester Institute of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 30 July 2002 Paper
Proceedings Volume 4691, (2002) https://doi.org/10.1117/12.474509
KEYWORDS: Photomasks, Optical proximity correction, Diffraction, Model-based design, Lithography, Convolution, Image filtering, Printing, SRAF, Signal processing

Proceedings Article | 8 December 1995 Paper
Charles Sauer, Robert Dean, Etsuya Morita, Zoilo Tan, Bruce Smith, Dale Ewbank, Sid Duttagupta, Anne Rudack
Proceedings Volume 2621, (1995) https://doi.org/10.1117/12.228215
KEYWORDS: Etching, Polonium, Dry etching, Chemically amplified resists, Photoresist processing, Plasma etching, Plasma, Resistance, Niobium, Critical dimension metrology

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