Mr. Dale Long
Chief Technology Officer at Advanced Thin Films
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 27, 1996
Proc. SPIE. 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
KEYWORDS: Diffraction, Refractive index, Multilayers, Crystals, Interfaces, Optical coatings, Polarizers, Transmission electron microscopy, Ion beams, Laser damage threshold

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