Dr. Dale E. Newbury Profile

Dr. Dale E. Newbury

at National Institute of Standards and Technology

SPIE Involvement:

Editor | Author

Proceedings Article | 21 October 2015 Paper

Electron-excited energy dispersive x-ray spectrometry in the variable pressure scanning electron microscope (EDS/VPSEM): it's not microanalysis anymore!

Dale Newbury, Nicholas W. Ritchie

Proceedings Volume 9636, 96360T (2015) https://doi.org/10.1117/12.2191088

KEYWORDS: Particles, X-rays, Scattering, Scanning electron microscopy, Monte Carlo methods, Copper, Protactinium, Laser scattering, Oxygen, Nickel

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Proceedings Article | 16 September 2014 Paper

Rigorous quantitative elemental microanalysis by scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) with spectrum processing by NIST DTSA-II

Dale Newbury, Nicholas W. Ritchie

Proceedings Volume 9236, 92360H (2014) https://doi.org/10.1117/12.2065842

KEYWORDS: Error analysis, X-rays, Manganese, Spectroscopy, Sensors, Chemical elements, X-ray detectors, Silicon, Glasses, Scanning electron microscopy

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Proceedings Article | 29 May 2013 Open Access

Scanning electron microscopy/energy dispersive spectrometry fixedbeam or overscan x-ray microanalysis of particles can miss the real structure: x-ray spectrum image mapping reveals the true nature

Dale Newbury, Nicholas W. Ritchie

Proceedings Volume 8729, 872902 (2013) https://doi.org/10.1117/12.2011790

KEYWORDS: Particles, X-rays, Sensors, X-ray imaging, X-ray detectors, Scanning electron microscopy, Spectroscopy, Silicon, Nickel, X-ray technology

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Proceedings Article | 14 May 2012 Paper

Faults and foibles of quantitative scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS)

Dale Newbury, Nicholas W. Ritchie

Proceedings Volume 8378, 837803 (2012) https://doi.org/10.1117/12.912770

KEYWORDS: X-rays, Error analysis, Scanning electron microscopy, Absorption, Chemical elements, X-ray detectors, X-ray microscopy, Spectroscopy, Aluminum, Lead

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Proceedings Article | 1 June 2011 Open Access

Is scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDS) quantitative? Effect of specimen shape

Dale Newbury, Nicholas W. Ritchie

Proceedings Volume 8036, 803602 (2011) https://doi.org/10.1117/12.881040

KEYWORDS: X-rays, Polishing, Glasses, Scanning electron microscopy, Iron, Magnesium, Spectroscopy, Sensors, Error analysis, X-ray detectors

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Proceedings Article | 3 June 2010 Paper

Pushing the envelope with SEM/SDD-EDS mapping: X-ray spectrum image mapping in 30 seconds or less, but what are the real limits?

Dale Newbury

Proceedings Volume 7729, 77290F (2010) https://doi.org/10.1117/12.853519

KEYWORDS: X-rays, X-ray imaging, Aluminum, X-ray detectors, Sensors, Particles, Iron, Scanning electron microscopy, Manganese, Optical character recognition

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Proceedings Article | 3 June 2009 Paper

Solving the micro-to-macro spatial scale problem with milliprobe x-ray fluorescence/x-ray spectrum imaging

Dale Newbury, Jeff Davis

Proceedings Volume 7378, 73780P (2009) https://doi.org/10.1117/12.824629

KEYWORDS: X-rays, X-ray imaging, Potassium, X-ray fluorescence spectroscopy, Scanning electron microscopy, Rhodium, Spectroscopy, Ionization, Manganese, X-ray detectors

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Proceedings Article | 3 June 2009 Paper

Characterizing heterogeneous particles with SEM/SDD-EDS mapping and NIST Lispix

Dale Newbury, Nicholas Ritchie, David Bright

Proceedings Volume 7378, 73780Q (2009) https://doi.org/10.1117/12.820874

KEYWORDS: Particles, X-rays, Atmospheric particles, X-ray imaging, Scanning electron microscopy, Optical character recognition, Sensors, Associative arrays, Nickel, Databases

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Proceedings Article | 26 September 1995 Paper

Microanalysis to nanoanalysis: analytical techniques for chemical characterization of micrometer- to nanometer-scale structures

Dale Newbury

Proceedings Volume 2640, (1995) https://doi.org/10.1117/12.222653

KEYWORDS: Electrons, X-rays, Particles, Chemical species, Ions, Chemical analysis, Scattering, Photons, Laser scattering, Scanning electron microscopy

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