Dr. Dale E. Newbury
at National Institute of Standards and Technology
SPIE Involvement:
Editor | Author
Publications (9)

Proceedings Article | 21 October 2015 Paper
Proc. SPIE. 9636, Scanning Microscopies 2015
KEYWORDS: Scattering, Particles, X-rays, Copper, Nickel, Laser scattering, Oxygen, Scanning electron microscopy, Monte Carlo methods, Protactinium

Proceedings Article | 16 September 2014 Paper
Proc. SPIE. 9236, Scanning Microscopies 2014
KEYWORDS: Sensors, Glasses, Spectroscopy, Error analysis, X-rays, Silicon, Scanning electron microscopy, Manganese, Chemical elements, X-ray detectors

Proceedings Article | 29 May 2013 Paper
Proc. SPIE. 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Sensors, Spectroscopy, Particles, X-rays, Nickel, Silicon, Scanning electron microscopy, X-ray imaging, X-ray detectors, X-ray technology

Proceedings Article | 14 May 2012 Paper
Proc. SPIE. 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Spectroscopy, Error analysis, X-rays, X-ray microscopy, Scanning electron microscopy, Aluminum, Chemical elements, X-ray detectors, Lead, Absorption

Proceedings Article | 1 June 2011 Paper
Proc. SPIE. 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Polishing, Magnesium, Iron, Sensors, Glasses, Spectroscopy, Error analysis, X-rays, Scanning electron microscopy, X-ray detectors

Showing 5 of 9 publications
Proceedings Volume Editor (9)

Showing 5 of 9 publications
Conference Committee Involvement (11)
Scanning Microscopies 2015
29 September 2015 | Monterey, California, United States
Scanning Microscopies 2014
16 September 2014 | Monterey, California, United States
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
30 April 2013 | Baltimore, Maryland, United States
Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
24 April 2012 | Baltimore, Maryland, United States
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
26 April 2011 | Orlando, Florida, United States
Showing 5 of 11 Conference Committees
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