Damien Deubel
at KERDRY Thin Film Technologies
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | January 2, 2015
OE Vol. 54 Issue 01
KEYWORDS: Optical filters, Thin films, Scanning electron microscopy, Dispersion, Dielectrics, Glasses, Near infrared, Multilayers, Optical properties, Data modeling

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