Prof. Damien P. Kelly
at National University of Ireland, Dublin
SPIE Involvement:
Conference Program Committee | Author
Publications (34)

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Diffusers, Scattering, Statistical analysis, Light scattering, Laser scattering, Laser optics, Speckle, Optical alignment, Speckle pattern, 3D metrology, Optical inspection, Inspection

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Fourier transforms, Charge-coupled devices, Geometrical optics, Transform theory, Reconstruction algorithms, Digital holography, Metrology, Phase retrieval, Speckle metrology, Phase measurement, Optical testing, Refractive index, Biological research, Paraxial approximations, Holography

PROCEEDINGS ARTICLE | June 1, 2016
Proc. SPIE. 9867, Three-Dimensional Imaging, Visualization, and Display 2016
KEYWORDS: Electroluminescent displays, Speckle, Sensors, Geometrical optics, Statistical analysis, Transform theory, Remote sensing, 3D metrology, Wave propagation, Charge-coupled devices

SPIE Journal Paper | March 28, 2016
OE Vol. 55 Issue 03
KEYWORDS: Digital holography, Phase retrieval, Holograms, Cameras, Image quality, Reconstruction algorithms, Phase shift keying, Wavefronts, Optical engineering, Modulation

PROCEEDINGS ARTICLE | September 22, 2015
Proc. SPIE. 9599, Applications of Digital Image Processing XXXVIII
KEYWORDS: Phase retrieval, Fourier transforms, Cameras, Digital holography, Image retrieval, Holograms, Reconstruction algorithms, Detection and tracking algorithms, Phase shifts, Image enhancement

PROCEEDINGS ARTICLE | September 9, 2015
Proc. SPIE. 9598, Optics and Photonics for Information Processing IX
KEYWORDS: Glasses, Refractive index, Speckle, Diffusers, Statistical analysis, Diffraction, Charge-coupled devices, Speckle pattern, Free space optics, Metrology

Showing 5 of 34 publications
Conference Committee Involvement (3)
Dimensional Optical Metrology and Inspection for Practical Applications VII
15 April 2018 | Orlando, Florida, United States
Holography: Advances and Modern Trends
24 April 2017 | Prague, Czech Republic
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
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