Prof. Damien P. Kelly
at National University of Ireland, Dublin
SPIE Involvement:
Conference Program Committee | Author
Publications (34)

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Statistical analysis, Speckle, Scattering, Light scattering, Inspection, Laser scattering, Optical inspection, Speckle pattern, Diffusers, 3D metrology, Optical alignment, Laser optics

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Refractive index, Holography, Metrology, Digital holography, Fourier transforms, Optical testing, Transform theory, Phase retrieval, Speckle metrology, Charge-coupled devices, Reconstruction algorithms, Biological research, Phase measurement, Geometrical optics, Paraxial approximations

PROCEEDINGS ARTICLE | June 1, 2016
Proc. SPIE. 9867, Three-Dimensional Imaging, Visualization, and Display 2016
KEYWORDS: Statistical analysis, Speckle, Sensors, Remote sensing, Transform theory, Wave propagation, 3D metrology, Charge-coupled devices, Geometrical optics, Electroluminescent displays

SPIE Journal Paper | March 28, 2016
OE Vol. 55 Issue 03
KEYWORDS: Digital holography, Phase retrieval, Holograms, Cameras, Image quality, Reconstruction algorithms, Phase shift keying, Wavefronts, Optical engineering, Modulation

PROCEEDINGS ARTICLE | September 22, 2015
Proc. SPIE. 9599, Applications of Digital Image Processing XXXVIII
KEYWORDS: Holograms, Digital holography, Detection and tracking algorithms, Cameras, Fourier transforms, Phase retrieval, Image enhancement, Image retrieval, Reconstruction algorithms, Phase shifts

PROCEEDINGS ARTICLE | September 9, 2015
Proc. SPIE. 9598, Optics and Photonics for Information Processing IX
KEYWORDS: Diffraction, Refractive index, Metrology, Statistical analysis, Speckle, Glasses, Speckle pattern, Diffusers, Free space optics, Charge-coupled devices

Showing 5 of 34 publications
Conference Committee Involvement (3)
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Holography: Advances and Modern Trends
24 April 2017 | Prague, Czech Republic
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
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