Ms. Dan Chen Profile

Dan Chen

at Tianjin Jinhang Institute of Technical Physics

SPIE Involvement:

Author

Publications (5)

SPIE Journal Paper | 25 November 2021

Infrared optical properties of SiO₂ films on silicon substrate under different temperatures

Yugang Jiang, Huasong Liu, Jinlin Bai, Ziyang Li, Xiao Yang, Dan Chen, Jiahuan He, Lishuan Wang, Dandan Liu

OE, Vol. 61, Issue 03, 031204, (November 2021) https://doi.org/10.1117/12.10.1117/1.OE.61.3.031204

KEYWORDS: Refractive index, Silicon films, Silicon, FT-IR spectroscopy, Temperature metrology, Optical properties, Infrared radiation, Dielectrics, Transmittance, Silica

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Proceedings Article | 8 July 2019 Paper

Annealing effects on optical and structural properties of TiO2 thin films deposited by ion beam sputtering

Yugang Jiang, Jiahuan He, Lishuan Wang, Shida Li, Dan Chen, Meiping Zhu, Huasong Liu

Proceedings Volume 11064, 110640H (2019) https://doi.org/10.1117/12.2539044

KEYWORDS: Thin films, Titanium dioxide, Annealing, Refractive index, Sputter deposition, Ion beams, Transmittance, Optical properties, Thermal effects, Temperature metrology

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Proceedings Article | 8 July 2019 Paper

Study on band gap and dispersion model of Al2O3 thin films with different oxygen flow rates by ion beam sputtering

Jiahuan He, Dan Chen, Lishuan Wang, Shida Li, Dandan Liu, Yugang Jiang, Meiping Zhu, Huasong Liu

Proceedings Volume 11064, 1106413 (2019) https://doi.org/10.1117/12.2539622

KEYWORDS: Thin films, Ion beams, Absorption, Sputter deposition, Reflection, Surface roughness

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Proceedings Article | 8 July 2019 Paper

Annealing effects on the optical and structural properties of Y2O3 thin films deposited by thermal evaporation technique

Shida Li, Huasong Liu, Yugang Jiang, Meiping Zhu, Dan Chen, Xiao Yang, Lishuan Wang, Jiahuan He, Dongbai Xue

Proceedings Volume 11064, 1106415 (2019) https://doi.org/10.1117/12.2539549

KEYWORDS: Annealing, Thin films, Refractive index, Absorption, Transmittance, Optical properties, Crystals, Thermography, Diffraction, Thin film deposition

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Proceedings Article | 12 December 2018 Paper

Study on the design and preparation of wideband deep cutoff bandpass filter

Yugang Jiang, Huasong Liu, Dan Chen, Lishuan Wang, Dandan Liu, Shida Li, Jiahuan He, Chenghui Jiang, Yiqin Ji

Proceedings Volume 10847, 1084708 (2018) https://doi.org/10.1117/12.2504060

KEYWORDS: Transmittance, Bandpass filters, Refractive index, Ion beams, Sputter deposition, Tantalum, Thin films, Optical filters, Manufacturing, Spectrophotometry

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