CONFERENCE PROCEEDINGS
Advanced Search
Dan T. Kuo
Dir. of Advanced Cryocooler Bu at L3Harris Technologies Inc
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 21 May 2011 Paper
Stirling-cycle cooler reliability growth at L-3 CE
David Arndt, Dan Kuo, Quang Phan
Proceedings Volume 8012, 80122P (2011) https://doi.org/10.1117/12.884801
KEYWORDS: Data modeling, Reliability, Failure analysis, Cryocoolers, Contamination, Cerium, Electronics, Systems modeling, Testing and analysis, Infrared technology
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top