Dan Schumacher
IC AE Manager Globals at Mentor Graphics Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 24 March 2017 Presentation + Paper
Proc. SPIE. 10147, Optical Microlithography XXX
KEYWORDS: Optical lithography, Cadmium, Visualization, Databases, Design for manufacturing, Photomasks, Semiconductor manufacturing, Computational lithography, Optical proximity correction, Semiconducting wafers, Resolution enhancement technologies

Proceedings Article | 18 March 2015 Paper
Proc. SPIE. 9427, Design-Process-Technology Co-optimization for Manufacturability IX
KEYWORDS: Photovoltaics, Optical lithography, Aerospace engineering, Visualization, Databases, Metals, Manufacturing, Legal, Optical proximity correction, Resolution enhancement technologies

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