Dandan Cui
at Changchun University of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 November 2015
Proc. SPIE. 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
KEYWORDS: Silica, Etching, Interfaces, Silicon, Surface roughness, Corrosion, Silicon films, Wet etching, Semiconducting wafers, Electrochemical etching

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