Mr. Dane J. Phillips
Engineer/Scientist at IERUS Technologies Inc
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10655, Polarization: Measurement, Analysis, and Remote Sensing XIII
KEYWORDS: Staring arrays, Mid-IR, Polarization, Imaging systems, Cameras, Sensors, Silicon, Image resolution, Polarizers, Polarimetry

PROCEEDINGS ARTICLE | April 27, 2010
Proc. SPIE. 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense
KEYWORDS: Spectroscopy, Remote sensing, Molecules, Carbon dioxide lasers, Infrared spectroscopy, Terahertz radiation, Infrared radiation, Infrared signatures, Atmospheric sensing, Absorption

PROCEEDINGS ARTICLE | May 1, 2009
Proc. SPIE. 7311, Terahertz Physics, Devices, and Systems III: Advanced Applications in Industry and Defense
KEYWORDS: Semiconductors, Switches, Semiconductor lasers, Gallium nitride, Terahertz radiation, Wide bandgap semiconductors, Sapphire lasers, Silicon carbide, Zinc oxide, Pulsed laser operation

PROCEEDINGS ARTICLE | April 29, 2009
Proc. SPIE. 7307, Airborne Intelligence, Surveillance, Reconnaissance (ISR) Systems and Applications VI
KEYWORDS: Staring arrays, Optical filters, Polarization, Imaging systems, Polarizers, Polarimetry, Image registration, Ray tracing, Imaging arrays, Systems modeling

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