Dr. Daniel Crespo Vazquez
at Indizen Optical Technologies
SPIE Involvement:
Author
Publications (10)

PROCEEDINGS ARTICLE | June 18, 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: MATLAB, Fringe analysis, Modulation, Spatial frequencies, Fourier transforms, Phase shift keying, Demodulation, Optical metrology, Filtering (signal processing), RGB color model

PROCEEDINGS ARTICLE | June 18, 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Fringe analysis, Detection and tracking algorithms, Modulation, Error analysis, Fourier transforms, Phase shift keying, Demodulation, Optical metrology, Signal analyzers, Signal detection

SPIE Journal Paper | October 1, 2006
OE Vol. 45 Issue 10
KEYWORDS: 3D metrology, Binary data, RGB color model, 3D modeling, 3D image processing, Optical engineering, Projection systems, Cameras, Spatial resolution, Structured light

SPIE Journal Paper | February 1, 2006
OE Vol. 45 Issue 02
KEYWORDS: Glasses, 3D scanning, Calibration, 3D metrology, Imaging systems, Distortion, Cameras, Phase measurement, Optical scanning systems, Optical engineering

PROCEEDINGS ARTICLE | July 7, 2005
Proc. SPIE. 5840, Photonic Materials, Devices, and Applications
KEYWORDS: Optical components, Photodetectors, Light sources, Reticles, Computer programming, Head, Optoelectronic devices, Optical encoders, Geometrical optics, Diffraction gratings

PROCEEDINGS ARTICLE | July 7, 2005
Proc. SPIE. 5840, Photonic Materials, Devices, and Applications
KEYWORDS: Chromatic aberrations, Beam splitters, Sensors, Control systems, Semiconductor lasers, Photoresist materials, Collimation, Optical simulations, Signal detection, Laser systems engineering

Showing 5 of 10 publications
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