Daniel Decruppe
at CEA-LETI
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 10, 2004
Proc. SPIE. 5273, Laser-Induced Damage in Optical Materials: 2003
KEYWORDS: Silica, Etching, Laser induced damage, Diagnostics, Process control, Gas lasers, Laser damage threshold, Radiometry, Cartography, Carbon monoxide

PROCEEDINGS ARTICLE | February 26, 2004
Proc. SPIE. 5252, Optical Fabrication, Testing, and Metrology
KEYWORDS: Optical components, Silica, Etching, Laser induced damage, Carbon dioxide lasers, Diagnostics, Gas lasers, Radiometry, Carbon monoxide, Surface finishing

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