Prof. Dan M. Fleetwood
Professor EECS & Chair at Vanderbilt Univ
SPIE Involvement:
Publications (5)

Proceedings Article | 8 March 2014
Proc. SPIE. 8986, Gallium Nitride Materials and Devices IX
KEYWORDS: Thermography, Switching, Spectroscopy, Reliability, Gallium nitride, Capacitance, Optical spectroscopy, Transistors, Field effect transistors, Metalorganic chemical vapor deposition

Proceedings Article | 29 May 2013
Proc. SPIE. 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V
KEYWORDS: Optical properties, Ultraviolet radiation, Luminescence, X-rays, Electrons, Silicon, Nitrogen, Quantum dots, Gamma radiation, X-ray fluorescence spectroscopy

Proceedings Article | 23 May 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Oxides, Annealing, Dielectrics, Silicon, Measurement devices, Aluminum, Transistors, Field effect transistors, Molybdenum, Semiconducting wafers

Proceedings Article | 12 May 2003
Proc. SPIE. 5113, Noise in Devices and Circuits
KEYWORDS: Oxides, Silicon, Diffusion, Measurement devices, Transistors, Field effect transistors, Radiation effects, Molybdenum, Semiconducting wafers, Temperature metrology

Proceedings Article | 9 May 2003
Proc. SPIE. 5112, Noise as a Tool for Studying Materials
KEYWORDS: Oxides, Chemical species, Annealing, Interfaces, Silicon, Hydrogen, Reliability, Transistors, Molybdenum, Temperature metrology

Proceedings Volume Editor (1)

SPIE Conference Volume | 23 May 2005

Conference Committee Involvement (3)
Noise and Fluctuations in Circuits, Devices, and Materials
21 May 2007 | Florence, Italy
Noise in Devices and Circuits III
24 May 2005 | Austin, Texas, United States
Noise as a Tool for Studying Materials
2 June 2003 | Santa Fe, New Mexico, United States
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