Dr. Daniel S. Green
Technical Manager at Qorvo Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 February 2008
Proc. SPIE. 6894, Gallium Nitride Materials and Devices III
KEYWORDS: Switches, Reliability, Resistance, Amplifiers, Gallium nitride, Transistors, Field effect transistors, Silicon carbide, Semiconducting wafers, Temperature metrology

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