We present test results from a compact, fast (F/1.4) imaging spectrometer system with a 33° field of view, operating in
the 450-1650 nm wavelength region with an extended response InGaAs detector array. The system incorporates a simple
two-mirror telescope and a steeply concave bilinear groove diffraction grating made with gray scale x-ray lithography
techniques. High degree of spectral and spatial uniformity (97%) is achieved.