Daniel Kayser
at A & A Technologies GmbH
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Sensors, Image segmentation, Ceramics, Inspection, Image resolution, Feature extraction, Image sensors, Fractal analysis, Shape analysis, Tolerancing

PROCEEDINGS ARTICLE | September 10, 2005
Proc. SPIE. 5908, Optical Information Systems III
KEYWORDS: Holograms, Holography, Data compression, Image compression, Digital holography, Speckle, Quantization, Optical simulations, Electromagnetism, Phase shifts

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5880, Optical Diagnostics
KEYWORDS: Point spread functions, Holograms, Radon, Digital holography, Imaging systems, CCD cameras, Optical diagnostics, Synthetic apertures, Information technology, Charge-coupled devices

SPIE Journal Paper | October 1, 2004
OE Vol. 43 Issue 10
KEYWORDS: Fractal analysis, Sensors, Projection systems, Wavelets, Inspection, Cameras, Detection and tracking algorithms, Tolerancing, Optical engineering, Image resolution

PROCEEDINGS ARTICLE | May 27, 2003
Proc. SPIE. 4933, Speckle Metrology 2003
KEYWORDS: Optical filters, Eye, Fringe analysis, Spatial frequencies, Wavelets, Interferometry, Spatial light modulators, Image filtering, Image classification, Optical correlators

PROCEEDINGS ARTICLE | May 22, 2003
Proc. SPIE. 5011, Machine Vision Applications in Industrial Inspection XI
KEYWORDS: Eye, Fringe analysis, Spatial frequencies, Wavelets, Interferometry, Spatial light modulators, Image filtering, Image classification, Holographic interferometry, Optical correlators

Showing 5 of 12 publications
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