Daniel Mansfield
Research Manager/Company Physicist at AMETEK Taylor Hobson Ltd
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | February 27, 2016
Proc. SPIE. 9749, Oxide-based Materials and Devices VII
KEYWORDS: Thin films, Ellipsometry, Refractive index, Light sources, Metrology, Silica, Interfaces, Silicon, Surface roughness, Interferometry, Optical testing, 3D metrology, Objectives, Optical interferometry, Radium

PROCEEDINGS ARTICLE | May 10, 2014
Proc. SPIE. 9130, Micro-Optics 2014
KEYWORDS: Confocal microscopy, Chromatic aberrations, Microscopes, Optical design, Single point diamond turning, Manufacturing, Lens design, Colorimetry, Aspheric lenses, Optics manufacturing

PROCEEDINGS ARTICLE | May 8, 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Point spread functions, Refractive index, Optical spheres, Calibration, Mercury, Interferometry, Linear filtering, Image filtering, Electronic filtering, Spherical lenses

PROCEEDINGS ARTICLE | September 25, 2008
Proc. SPIE. 7101, Advances in Optical Thin Films III
KEYWORDS: Thin films, Modulation, Reflection, Glasses, Interfaces, Silicon, Reflectivity, Atomic force microscopy, Optical interferometry, Spectrophotometry

PROCEEDINGS ARTICLE | May 14, 2007
Proc. SPIE. 10316, Optifab 2007: Technical Digest
KEYWORDS: Thin films, Refractive index, Multilayers, Silica, Reflection, Reflectivity, Interferometry, Chromium, Optical interferometry, Thin film deposition

PROCEEDINGS ARTICLE | May 3, 2006
Proc. SPIE. 6186, MEMS, MOEMS, and Micromachining II
KEYWORDS: Thin films, Refractive index, Multilayers, Silicon, Reflectivity, Adaptive optics, Solids, Optical interferometry, Spectrophotometry, Thin film coatings

Showing 5 of 7 publications
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