Dr. Daniel Rugar
Manager at IBM Research - Almaden
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 May 2003
Proc. SPIE. 5112, Noise as a Tool for Studying Materials
KEYWORDS: Microscopes, Microscopy, Particles, Silicon, Magnetism, Interference (communication), Cobalt, Microwave radiation, Signal detection, Nanowires

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