Dr. Daniel Tomaszewski
at Institute of Electron Technology
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | December 22, 2016
Proc. SPIE. 10175, Electron Technology Conference 2016
KEYWORDS: Semiconductors, Oxides, Matrices, Manufacturing, Optoelectronics, Microelectronics, Transistors, CMOS technology, Semiconducting wafers, Prototyping

PROCEEDINGS ARTICLE | December 22, 2016
Proc. SPIE. 10175, Electron Technology Conference 2016
KEYWORDS: Sensors, Electrodes, Silicon, Resistance, Capacitance, Terahertz radiation, Transistors, Antennas, Field effect transistors, Semiconducting wafers

PROCEEDINGS ARTICLE | August 19, 2014
Proc. SPIE. 9291, 13th International Scientific Conference on Optical Sensors and Electronic Sensors
KEYWORDS: Polymethylmethacrylate, Capacitors, Silica, Electrodes, Silicon, Data acquisition, Capacitance, Transducers, Diodes, Aluminum

PROCEEDINGS ARTICLE | July 25, 2013
Proc. SPIE. 8902, Electron Technology Conference 2013
KEYWORDS: Silicon, Manufacturing, Resistance, Capacitance, Aluminum, Transistors, CMOS technology, Resistors, Molybdenum, Semiconducting wafers

PROCEEDINGS ARTICLE | July 25, 2013
Proc. SPIE. 8902, Electron Technology Conference 2013
KEYWORDS: Nanosensors, Sensors, Etching, Electrodes, Dielectrics, Silicon, Oxygen, Field effect transistors, Microsensors, HF etching

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