Daniel M. Topa
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 14 October 2004
Proc. SPIE. 5523, Current Developments in Lens Design and Optical Engineering V
KEYWORDS: Monochromatic aberrations, Sensors, Error analysis, Manufacturing, Wavefront sensors, Wavefronts, Optical testing, Collimation, Distance measurement, Charge-coupled devices

Proceedings Article | 24 November 2002
Proc. SPIE. 4794, Vision Geometry XI
KEYWORDS: Sensors, Matrices, Wavefront sensors, Wavefronts, Data processing, Charge-coupled devices, Reconstruction algorithms, Wavefront reconstruction, Semiconducting wafers, Wafer testing

Proceedings Article | 4 November 2002
Proc. SPIE. 4809, Nanoscale Optics and Applications
KEYWORDS: Wafer-level optics, Polishing, Interferometers, Sensors, Silicon, Manufacturing, Interferometry, Wavefronts, Semiconducting wafers, Surface finishing

Proceedings Article | 4 September 2002
Proc. SPIE. 4769, Optical Design and Analysis Software II
KEYWORDS: Matrices, Wavefront sensors, Wavefronts, Optical analysis, Computer programming, Zernike polynomials, Mathematics, C++, Matrix multiplication, Spherical lenses

Proceedings Article | 4 September 2002
Proc. SPIE. 4769, Optical Design and Analysis Software II
KEYWORDS: Staring arrays, Sensors, Wavefront sensors, Wavefronts, Optical analysis, Zernike polynomials, Charge-coupled devices, Reconstruction algorithms, Wavefront reconstruction, Data analysis

Showing 5 of 8 publications
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