Dr. Daniel P. Violette Profile

Dr. Daniel P. Violette

Publications (9)

SPIE Journal Paper | 24 March 2023

Imaging effects due to pixel distortions in CdZnTe detectors—results from the HREXI Calibration Facility

Arkadip Basak, Branden Allen, Jae Sub Hong, Daniel Violette, Jonathan Grindlay

JATIS, Vol. 9, Issue 01, 018005, (March 2023) https://doi.org/10.1117/12.10.1117/1.JATIS.9.1.018005

KEYWORDS: Image restoration, Telescopes, Signal to noise ratio, X-rays, Detector arrays, Calibration, X-ray sources, X-ray detectors, Spatial resolution, Detector development

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SPIE Journal Paper | 31 January 2023

Tuning of nuclear spectroscopic telescope array application specific integrated circuits to improve low energy threshold of future hard x-ray imaging detectors

Daniel Violette, Branden Allen, Jae Sub Hong, Hiromasa Miyasaka, Jonathan Grindlay

JATIS, Vol. 9, Issue 01, 016001, (January 2023) https://doi.org/10.1117/12.10.1117/1.JATIS.9.1.016001

KEYWORDS: Application specific integrated circuits, Image resolution, Telescopes, Detector arrays, X-ray telescopes, Analog electronics, Spectroscopy, Pixel resolution, Spectroscopes, Capacitors

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SPIE Journal Paper | 4 July 2022

Testing station for fast screening of through silicon via-enabled application-specific integrated circuits for hard x-ray imaging detectors

Daniel Violette, Branden Allen, Jaesub Hong, Hiromasa Miyasaka, Jonathan Grindlay

JATIS, Vol. 8, Issue 03, 036001, (July 2022) https://doi.org/10.1117/12.10.1117/1.JATIS.8.3.036001

KEYWORDS: Sensors, Silicon, Wafer testing, Image resolution, Semiconducting wafers, Hard x-rays, Detector arrays, Application specific integrated circuits, X-rays, X-ray telescopes

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Proceedings Article | 5 August 2021 Presentation

Optimization of CdZnTe low energy threshold utilizing readout ASIC charge pumping for the High-Resolution Energetic X-ray Imager SmallSat Explorer

Daniel Violette, Jaesub Hong, Branden Allen, Jonathan Grindlay

Proceedings Volume 11821, 118210S (2021) https://doi.org/10.1117/12.2594853

KEYWORDS: X-ray imaging, Sensors, Hard x-rays, X-rays, X-ray telescopes, X-ray detectors, Telescopes, Stars, Spectroscopy, Spectral resolution

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SPIE Journal Paper | 9 April 2021

Proof of concept for through silicon vias in application-specific integrated circuits for hard x-ray imaging detectors

Jaesub Hong, Jonathan Grindlay, Branden Allen, Daniel Violette, Hiromasa Miyasaka, Dean Malta, Jennifer Ovental, David Bordelon, Daniel Richter

JATIS, Vol. 7, Issue 02, 026001, (April 2021) https://doi.org/10.1117/12.10.1117/1.JATIS.7.2.026001

KEYWORDS: Sensors, Semiconducting wafers, Silicon, Application specific integrated circuits, Copper, Signal processing, Etching, X-ray telescopes, Spectral resolution, Packaging

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SPIE Journal Paper | 22 April 2020

HREXI calibration facility: mapping out subpixel-level responses from high-resolution cadmium zinc telluride imaging x-ray detectors

Arkadip Basak, Branden Allen, Jaesub Hong, Daniel Violette, Jonathan Grindlay

JATIS, Vol. 6, Issue 02, 026002, (April 2020) https://doi.org/10.1117/12.10.1117/1.JATIS.6.2.026002

KEYWORDS: Sensors, Calibration, Tungsten, X-ray detectors, X-rays, Cadmium, Zinc, Lead, Aluminum, Detector development

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Proceedings Article | 9 September 2019 Presentation

High-resolution x-ray imaging spectrometer (HREXI) SmallSat Pathfinder (HSP) (Conference Presentation)

Jonathan Grindlay, Branden Allen, Jaesub Hong, Daniel Violette, Martin Elvis, Scott Barthelmy, John Tomsick

Proceedings Volume 11118, 111180X (2019) https://doi.org/10.1117/12.2529855

KEYWORDS: Image resolution, X-ray imaging, Spectroscopy, Coded apertures, X-rays, Astrophysics, Imaging systems, Telescopes, Sensors, Coded aperture imaging

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Proceedings Article | 9 September 2019 Presentation

Efficient screening of through-silicon-via (TSV) ASICs for CZT x-ray imaging detectors (Conference Presentation)

Daniel Violette, Branden Allen, Jaesub Hong, Jonathan Grindlay

Proceedings Volume 11118, 1111805 (2019) https://doi.org/10.1117/12.2529819

KEYWORDS: Sensors, X-ray imaging, Image sensors, Image resolution, X-ray telescopes, X-ray sources, Crystals, Electronics, Spectroscopy, Telescopes

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Proceedings Article | 13 September 2018 Presentation + Paper

Efficient validation testing of Through-Silicon-Via (TSV) ASICs for CZT x-ray detectors

Daniel Violette, Branden Allen, Jae Sub Hong, Arkadip Basak, Jonathan Grindlay

Proceedings Volume 10762, 107620S (2018) https://doi.org/10.1117/12.2321694

KEYWORDS: Sensors, X-ray telescopes, Field programmable gate arrays, Semiconducting wafers, X-ray detectors, Crystals, Aluminum, Coded apertures, Spectroscopy, Telescopes

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Showing 5 of 9 publications

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