Dr. Daniele Cocco
Staff Scientist at Lawrence Berkeley National Lab
SPIE Involvement:
Conference Program Committee | Author | Editor
Publications (48)

Proceedings Article | 25 August 2020 Presentation
Proc. SPIE. 11491, Advances in X-Ray/EUV Optics and Components XV
KEYWORDS: Cooling systems, Mirrors, Metrology, Mechanics, X-rays, Interferometry, Wavefronts, Space mirrors, Grazing incidence, Liquid crystal lasers

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11491, Advances in X-Ray/EUV Optics and Components XV
KEYWORDS: Mirrors, Light sources, Polarization, X-rays, Silicon, Nitrogen, Heat treatments, Cryogenics, Prototyping, Liquids

Proceedings Article | 21 August 2020 Presentation
Proc. SPIE. 11493, Advances in Computational Methods for X-Ray Optics V
KEYWORDS: Mirrors, Coherence (optics), Wavefronts, Adaptive optics, Wave propagation, Finite element methods, Optical simulations, Wavefront distortions, Monochromators, Beam propagation method

Proceedings Article | 11 September 2019 Paper
Proc. SPIE. 11111, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XIII
KEYWORDS: Optical systems, Diffraction, Mirrors, Optical design, Polishing, Wavefronts, Laser optics, Free electron lasers, Photon transport, Liquid crystal lasers

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Diffraction, Monochromatic aberrations, Mirrors, Sensors, Crystals, X-rays, Wavefront sensors, Wavefronts, Adaptive optics, Optical alignment, Hard x-rays

Showing 5 of 48 publications
Proceedings Volume Editor (2)

Conference Committee Involvement (21)
Advances in X-Ray/EUV Optics and Components XVI
1 August 2021 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XV
26 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in X-Ray/EUV Optics and Components XIV
14 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Showing 5 of 21 Conference Committees
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