Dr. Daniele Spiga
Physicist at SLAC National Accelerator Lab
SPIE Involvement:
Conference Chair | Conference Program Committee | Author
Area of Expertise:
X-ray Optics , Optical physics , Multilayer coatings , X-ray scattering , Surface metrology
Profile Summary

Daniele Spiga graduated in Physics from the Milano University in 2000. In 2005 he was awarded with the Ph.D. in Astrophysics and Astronomy at the Milano-Bicocca University, after defending a technological thesis developed at INAF/OAB (Brera Astronomical Observatory), devoted to the development of multilayer-coated mirrors for future X-ray telescopes. His Ph.D. Thesis was awarded with the "P. Tacchini" prize in 2005. In 2007 he appointed a position as INAF/OAB researcher. He has worked until January 2018 in the X-ray optics group at INAF/OAB on the surface metrology of X-ray mirrors, on optical simulations of mirror performances using physical optics and analytical methods, and on the development of new facilities for testing the optical elements of the ATHENA X-ray telescope. He has been Principal Investigator of the ESA-funded project SIMPOSiuM (Silicon Pore Optics Modelling and SImulations) for the ATHENA X-ray observatory, and of the BEaTriX (Beam Expander Testing X-ray Facility) project to realize a compact X-ray beamline to perform the functional tests of the focusing modules for ATHENA. Since February 2018, he works as Staff Engineer in the Optics & Metrology Department at SLAC-LCLS (Stanford University). His main interest is the development of software to consistently predict the imaging quality from metrology data.
Publications (109)

PROCEEDINGS ARTICLE | November 20, 2017
Proc. SPIE. 10565, International Conference on Space Optics — ICSO 2010
KEYWORDS: Telescopes, Mirrors, Multilayers, X-ray optics, X-rays, Coating, Space telescopes, Spatial resolution, Astronomical imaging, Hard x-rays

PROCEEDINGS ARTICLE | November 17, 2017
Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014
KEYWORDS: X-ray optics, Glasses, X-rays, Silicon, Surface roughness, Astronomical imaging, X-ray telescopes, Optics manufacturing, Zerodur, Prototyping

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Wafer-level optics, Diffraction, Mirrors, Optical design, X-rays, Silicon, Optical alignment, Spatial resolution, X-ray telescopes, Device simulation

PROCEEDINGS ARTICLE | September 8, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Polishing, Silica, Scattering, Image segmentation, Glasses, Spatial resolution, Fused quartz, X-ray telescopes, Semiconducting wafers, Ion beam finishing

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Semiconductors, Telescopes, Mirrors, X-ray optics, X-rays, Silicon, Spatial resolution, X-ray astronomy, X-ray telescopes, High energy astrophysics

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Point spread functions, Telescopes, Mirrors, X-ray optics, Optical alignment, Spatial resolution, X-ray telescopes, Mirror structures

Showing 5 of 109 publications
Conference Committee Involvement (11)
Adaptive X-Ray Optics V
21 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XIII
20 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
8 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Showing 5 of 11 published special sections
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