Dr. Daniele Spiga
Researcher at INAF Osservatorio Astronomico di Brera
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Area of Expertise:
X-ray Optics , Permanent magnets , Multilayer coatings , X-ray scattering , Surface metrology , Hot glass slumping
Profile Summary

Daniele Spiga graduated in Physics from the Milano University in 2000. In 2005 he was awarded with the Ph.D. in Astrophysics and Astronomy at the Milano-Bicocca University, after defending a technological thesis developed at INAF/OAB (Brera Astronomical Observatory), devoted to the development of multilayer-coated mirrors for future X-ray telescopes. His Ph.D. Thesis was awarded with the "P. Tacchini" prize in 2005. In 2007 he appointed a position as INAF/OAB researcher. He currently works in the X-ray optics group at INAF/OAB on the surface metrology of X-ray mirrors, on optical simulations of mirror performances using physical optics and analytical methods, and on the development of new facilities for testing the optical elements of the ATHENA X-ray telescope. His main interest is the development of software to consistently predict the imaging quality from metrology data.
Publications (109)

PROCEEDINGS ARTICLE | November 20, 2017
Proc. SPIE. 10565, International Conference on Space Optics — ICSO 2010
KEYWORDS: Telescopes, Mirrors, Multilayers, X-ray optics, X-rays, Coating, Space telescopes, Spatial resolution, Astronomical imaging, Hard x-rays

PROCEEDINGS ARTICLE | November 17, 2017
Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014
KEYWORDS: X-ray optics, Glasses, X-rays, Silicon, Surface roughness, Astronomical imaging, X-ray telescopes, Optics manufacturing, Zerodur, Prototyping

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Wafer-level optics, Diffraction, Mirrors, Optical design, X-rays, Silicon, Optical alignment, Spatial resolution, X-ray telescopes, Device simulation

PROCEEDINGS ARTICLE | September 8, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Polishing, Silica, Scattering, Image segmentation, Glasses, Spatial resolution, Fused quartz, X-ray telescopes, Semiconducting wafers, Ion beam finishing

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Semiconductors, Telescopes, Mirrors, X-ray optics, X-rays, Silicon, Spatial resolution, X-ray astronomy, X-ray telescopes, High energy astrophysics

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Point spread functions, Telescopes, Mirrors, X-ray optics, Optical alignment, Spatial resolution, X-ray telescopes, Mirror structures

Showing 5 of 109 publications
Conference Committee Involvement (11)
Adaptive X-Ray Optics V
19 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XIII
19 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
8 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Showing 5 of 11 published special sections
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top